DocumentCode :
398839
Title :
An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores
Author :
Bernardi, P. ; Rebaudengo, M. ; Reorda, M. Sonza
Author_Institution :
Dipt. di Autom. e Inf., Politecnico di Torino, Italy
Volume :
1
fYear :
2003
fDate :
16-19 Sept. 2003
Firstpage :
417
Abstract :
This paper addresses the issue of diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper. The proposed solution exploits a hardware-implemented compression method that minimizes the amount of data to be transferred from the core to the ATE. The proposed solution takes into account several constraints existing in an industrial environment, such as reducing the time and area overheads required for diagnosis, and minimizing the cost of the external ATE. Experimental results are provided allowing evaluating the benefits and limitations of the adopted solution.
Keywords :
automatic test equipment; built-in self test; fault diagnosis; integrated memory circuits; system-on-chip; ATE; BIST; P1500 compliant wrapper; SOC; area overheads reduction; automatic test equipment; built-in self test; compressed diagnostic information; embedded memory cores; hardware implemented compression; industrial environment; minimization; system-on-chip; time reduction; Built-in self-test; Costs; Data mining; Fault diagnosis; Lakes; Logic testing; Read-write memory; Semiconductor memory; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 2003. Proceedings. ETFA '03. IEEE Conference
Print_ISBN :
0-7803-7937-3
Type :
conf
DOI :
10.1109/ETFA.2003.1247736
Filename :
1247736
Link To Document :
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