Title :
A low-loss, compact wide-FSR-AWG using SiON planar lightwave circuit technology
Author :
Shimoda, Tatsuya ; Suzuki, Kenji ; Takaesu, S. ; Horie, Masaki ; Furukawa, A.
Author_Institution :
Networking Res. Lab., NEC Corp., Ibaraki, Japan
Abstract :
Wide FSR of 80 nm with SiON high-Δ technology reduced loss variation among channels of a 40-channel AWG to 0.6 dB with low insertion-loss of less than 2.2 dB for all channels without chip-size enlargement.
Keywords :
arrayed waveguide gratings; optical fabrication; optical losses; optical planar waveguides; refractive index; silicon compounds; wavelength division multiplexing; 0.6 dB; 2.2 dB; 80 nm; SiON; SiON planar lightwave circuit technology; chip-size reduction; compact wide-FSR-AWG; free spectral range; low insertion-loss; Arrayed waveguide gratings; Circuits; Laboratories; National electric code; Optical fiber polarization; Programmable control; Refractive index; Slabs; Stress; Wavelength division multiplexing;
Conference_Titel :
Optical Fiber Communications Conference, 2003. OFC 2003
Print_ISBN :
1-55752-746-6
DOI :
10.1109/OFC.2003.1248511
