Title :
Long-term reliability of high performance waveguide integrated photodetectors for 40 Gb/s applications and beyond
Author :
Tornow, S. ; Trommer, D. ; Umbach, A. ; Schumann, D.
Author_Institution :
U2t Photonics AG, Berlin, Germany
Abstract :
Waveguide integrated photodetectors for 40 Gb/s are promising candidates to serve an increasing demand for advanced components in telecommunications and measurement equipment. An overview on long-term reliability of those devices is given for chips and modules.
Keywords :
integrated circuit reliability; integrated optics; integrated optoelectronics; modules; optical waveguides; photodetectors; telecommunication; 40 Gbit/s; chips; long-term reliability; measurement equipment; modules; telecommunications; waveguide integrated photodetectors; Accelerated aging; Bandwidth; Optical device fabrication; Optical waveguides; P-i-n diodes; PIN photodiodes; Photodetectors; Semiconductor device measurement; Testing; Waveguide components;
Conference_Titel :
Optical Fiber Communications Conference, 2003. OFC 2003
Print_ISBN :
1-55752-746-6
DOI :
10.1109/OFC.2003.1248550
