DocumentCode :
3992
Title :
Accurate Power Circuit Loss Estimation Method for Power Converters With Si-IGBT and SiC-Diode Hybrid Pair
Author :
Takao, Kazuto ; Ohashi, H.
Author_Institution :
Electron Devices Lab., Toshiba Corp., Kawasaki, Japan
Volume :
60
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
606
Lastpage :
612
Abstract :
An accurate power circuit loss estimation method has been developed for designing power converters with hybrid pairs of silicon (Si) insulated-gate bipolar transistor (Si-IGBT) and silicon carbide (SiC) Schottky barrier diode/SiC p-i-n diode. An analytical model of the switching losses of the hybrid pairs is proposed to achieve high accuracy and short calculation time. The nonlinearity of the device parameters and the stray inductance in the circuit are considered in the model. For the accurate power loss calculation, an empirical parameter extraction method is introduced for extracting device parameters. The calculated circuit power losses are compared with measurement results, and good agreements are confirmed. By using the proposed method, the power loss of a power converter utilizing 4.5-kV Si-IGBT/SiC-p-i-n-diode hybrid pairs is estimated to investigate the upper limitation of the switching frequency.
Keywords :
Schottky diodes; elemental semiconductors; insulated gate bipolar transistors; p-i-n diodes; power convertors; power semiconductor diodes; semiconductor device models; silicon; silicon compounds; Schottky barrier diode; SiC; device parameter nonlinearity; empirical parameter extraction method; insulated gate bipolar transistor; p-i-n diode; power circuit loss estimation method; power converters; silicon-IGBT-silicon carbide-diode hybrid pair; stray inductance; switching frequency; switching loss analytical model; voltage 4.5 kV; Analytical models; Estimation; Integrated circuit modeling; Logic gates; P-i-n diodes; Silicon carbide; Switches; Insulated-gate bipolar transistors (IGBTs); Schottky barrier diode; p-i-n diode; power loss;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2226179
Filename :
6407994
Link To Document :
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