DocumentCode :
399518
Title :
Electrodynamic characteristics of the multilayered semiconductor-dielectric structure with diffraction grating
Author :
Abdulkadyrov, V.A. ; Khutoryan, E.M.
Author_Institution :
Usikov Inst. for Radiophys. & Electron., NASU, Kharkov, Ukraine
fYear :
2003
fDate :
23-25 Sept. 2003
Firstpage :
35
Lastpage :
38
Abstract :
The interaction of electromagnetic plane wave with multilayered semiconductor-dielectric structure with diffraction grating is studied. The algebraic set of equations of Fredholm type of second kind has been obtained. The reflection coefficient is numerically determined. It is shown that it can be less than unity (wave amplification) as well as less than unity (wave absorption).
Keywords :
dielectric materials; diffraction gratings; electrodynamics; electromagnetic wave absorption; electromagnetic wave reflection; multilayers; semiconductor materials; Fredholm type equations; algebraic equation set; diffraction grating; electrodynamic characteristics; electromagnetic plane wave; multilayered semiconductor-dielectric structure; reflection coefficient; wave absorption; wave amplification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory, 2003. DIPED 2003. Proceedings of 8th International Seminar/Workshop on
Conference_Location :
Lviv, Ukraine
Print_ISBN :
966-02-2888-0
Type :
conf
Filename :
1249792
Link To Document :
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