DocumentCode
399570
Title
Low cost convolutional code based concurrent error detection in FSMs
Author
Rokas, Konstantinos ; Makris, Yiorgos ; Gizopoulos, Dimitris
Author_Institution
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fYear
2003
fDate
3-5 Nov. 2003
Firstpage
344
Lastpage
351
Abstract
We discuss the use of convolutional codes to perform concurrent error detection (CED) in finite state machines (FSMs). We examine a previously proposed methodology, we identify its limitations, and we outline two improvements that reduce its cost and enhance its effectiveness. More specifically, we demonstrate how the existing FSM hardware can be reused for computing the convolutional code keys and we formulate the optimization problem of maximizing hardware reusability. Additionally we extend the proposed methodology to detect errors that only affect the output logic but not the next state of the FSM, and which are not detected by the previously proposed methodology.
Keywords
circuit optimisation; convolutional codes; error detection codes; finite state machines; logic design; FSM; concurrent error detection; convolutional code keys; finite state machines; hardware reusability maximization; hardware reuse; low cost CED; optimization; Automata; Circuits; Convolutional codes; Costs; Decoding; Delay; Fault detection; Hardware; Informatics; Logic;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN
1550-5774
Print_ISBN
0-7695-2042-1
Type
conf
DOI
10.1109/DFTVS.2003.1250130
Filename
1250130
Link To Document