DocumentCode
399867
Title
Novel spatial scanning technique for surface roughness measurement
Author
Xie, F. ; Zhang, W. ; Jiang, X.Q. ; Zhang, L. ; Bennion, I.
Author_Institution
Sch. of Eng., Huddersfield Univ., UK
Volume
1
fYear
2003
fDate
27-28 Oct. 2003
Firstpage
97
Abstract
We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.
Keywords
diffraction gratings; fibre optic sensors; optical fibre dispersion; optical scanners; surface topography measurement; chromatic dispersion device; diffraction grating; fiber optic interferometer; optical probe; spatial scanning; surface roughness measurement; wavelength scanning; Chromatic dispersion; Optical devices; Optical fibers; Optical interferometry; Optical surface waves; Probes; Rough surfaces; Surface roughness; Surface waves; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7888-1
Type
conf
DOI
10.1109/LEOS.2003.1251618
Filename
1251618
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