DocumentCode
399896
Title
Initial characterization of new coherent soft X-ray branchline at the advanced light source
Author
Rosfjord, Kristine ; Denham, Paul ; Kemp, Charles ; Gullikson, Eric ; Batson, Phillip ; Rekawa, Senajith ; Attwood, David
Author_Institution
Center for X-ray Opt., Lawrence Berkeley Nat. Lab., CA, USA
Volume
1
fYear
2003
fDate
27-28 Oct. 2003
Abstract
This study presents preliminary operation of a new coherent soft X-ray branchline at the advanced light source. This branch delivers spectrally and spatially coherent soft X-rays ranging from 200 eV to 1 keV photon energies (6.2 nm to 1.2 nm wavelength) using the third harmonic from an 8 cm period undulator. The increased energy range will allow interferometric techniques to be used in the extreme ultraviolet region to the soft X-ray region.
Keywords
X-ray optics; X-ray production; X-ray spectra; optical testing; ultraviolet spectra; 0.2 to 1 keV; 1.2 to 6.2 nm; advanced light source; coherent soft X-ray branchline; extreme ultraviolet region; interferometric techniques; soft X-ray region; undulator period; Bandwidth; Gratings; Light sources; Nitrogen; Optical filters; Optical interferometry; Power harmonic filters; Spatial coherence; Ultraviolet sources; Undulators;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7888-1
Type
conf
DOI
10.1109/LEOS.2003.1251654
Filename
1251654
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