Premature capacity loss in VRLA batteries for telecom applications

Author

Okada, Yuichi ; Tsuboi, Yuichi ; Shiomi, Masaaki ; Osumi, Shigeharu

Author_Institution

Japan Storage Battery Co. Ltd., Kyoto, Japan

fYear

2003

fDate

23-23 Oct. 2003

Firstpage

373

Lastpage

377

Abstract

The effect of depth of discharge (DOD) and discharge frequency on premature capacity loss (PCL) in valve regulated lead-acid (VRLA) batteries for stand by use was investigated. PCL showed a tendency to occur when batteries were discharged frequently to a shallow DOD. In order to clarify the reason of this result, changes of interfaces between positive grids and positive active materials (PAM) after charge-discharge cycles were investigated. It was found that PCL was a phenomenon due to the increase of the resistance between the positive grid and the PAM. PCL occurred when the adhesion between the grid and the PAM was poor, the concentration of H/sub 2/SO/sub 4/ around the grid/PAM interface was higher than the PAM and the corrosion layer was mainly consisted of /spl beta/-PbO/sub 2/.

Keywords

corrosion; hydrogen compounds; lead acid batteries; lead compounds; losses; sulphur compounds; telecommunication power supplies; H/sub 2/SO/sub 4/; PbO/sub 2/; charge-discharge cycles; depth of discharge; discharge frequency; positive active materials; premature capacity loss; valve regulated lead-acid batteries; Adhesives; Batteries; Capacity planning; Corrosion; Frequency; Gravity; Telecommunications; US Department of Defense; Valves; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Telecommunications Energy Conference, 2003. INTELEC '03. The 25th International

Conference_Location

Yokohama, Japan

Print_ISBN

4-88552-196-3

Type

conf

Filename

1252140