Title :
Minimized Device Junction Leakage Current at Forward-Bias Body and Applications for Low-Voltage Quadruple-Stacked Common-Gate Amplifier
Author_Institution :
Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Abstract :
Minimized device junction leakage current at forward-bias body and applications for low-voltage quadruple-stacked common-gate (CG) low-noise amplifier (LNA) is presented in this paper. Diode-connected MOSFETs are proposed to insert between the device bulks and forward bias, resulting in the back-to-back connected diodes and minimized junction leakage current. In addition, interstage matching networks are introduced to the quadruple-stacked CG stages to significantly enhance the small-signal gain of the amplifier. Based on the proposed circuit architectures, the fabricated 0.18-μm complementary metal-oxide-semiconductor LNA can operate at 0.5 V low supply voltage, exhibiting a measured low dc power dissipation of 6.3 mW, high gain of 16 dB, and low noise figure of 5.6 dB at 27.5 GHz. In addition, the theories for analyzing the proposed quadruple-stacked CG amplifier are given in detail, and the mechanisms are validated by experiments.
Keywords :
CMOS integrated circuits; MOSFET; leakage currents; low noise amplifiers; low-power electronics; complementary metal-oxide-semiconductor LNA; device junction leakage current; diode-connected MOSFET; forward-bias body; gain 16 dB; interstage matching networks; low-voltage quadruple-stacked common-gate low noise amplifier; noise figure 5.6 dB; power 6.3 mW; size 0.18 mum; small-signal gain; voltage 0.5 V; Gain; Impedance; Inductors; Junctions; Leakage currents; MOSFET; Noise; Diode-connected MOSFET; low-noise amplifier (LNA); low-noise amplifier (LNA).;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2309682