Title :
A superconducting single-photon detector for CMOS IC probing
Author :
Zhang, J. ; Pearlman, A. ; Slysz, W. ; Verevkin, A. ; Sobolewski, Roman ; Wilsher, K. ; Lo, W. ; Okunev, O. ; Korneev, Alexander ; Kouminov, P. ; Chulkova, G. ; Gol´tsman, Gregory N.
Author_Institution :
Rochester Univ., NY, USA
Abstract :
In this paper, a novel, time-resolved, NbN-based, superconducting single-photon detector (SSPD) has been developed for probing CMOS integrated circuits (ICs) using photon emission timing analysis (PETA).
Keywords :
CMOS integrated circuits; infrared spectra; niobium compounds; photoemission; superconducting photodetectors; time resolved spectra; timing jitter; CMOS IC probing; NbN; complementary metal-oxide-semiconductor integrated circuit probing; photon emission timing analysis; time-resolved superconducting single-photon detector; CMOS integrated circuits; Circuit testing; Detectors; High speed optical techniques; Histograms; Photonic integrated circuits; Superconducting integrated circuits; Temperature; Timing jitter; Voltage;
Conference_Titel :
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7888-1
DOI :
10.1109/LEOS.2003.1252944
