Title :
Long-Distance Trust-Free Quantum Key Distribution
Author :
Piparo, Nicolo Lo ; Razavi, Mohsen
Author_Institution :
Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds, UK
Abstract :
The feasibility of trust-free long-haul quantum key distribution (QKD) is addressed. We combine measurement-device-independent QKD, as an access technology, with a quantum repeater setup, at the core of future quantum communication networks. This will provide a quantum link none of whose intermediary nodes need to be trusted, or, in our terminology, a trust-free QKD link. As the main figure of merit, we calculate the secret key generation rate when a particular probabilistic quantum repeater protocol is in use. We assume the users are equipped with imperfect single photon sources, which can possibly emit two single photons, or laser sources to implement decoy-state techniques. We consider apparatus imperfection, such as quantum efficiency and dark count of photodetectors, path loss of the channel, and writing and reading efficiencies of quantum memories. By optimizing different system parameters, we estimate the maximum distance over which users can share secret keys when a finite number of memories are employed in the repeater setup.
Keywords :
protocols; quantum cryptography; access technology; apparatus imperfection; dark count; decoy-state techniques; imperfect single photon sources; laser sources; long-distance trust-free quantum key distribution; long-haul QKD; measurement-device-independent QKD; path loss; photodetectors; probabilistic quantum repeater protocol; quantum communication networks; quantum efficiency; quantum link; quantum memories; quantum repeater setup; reading efficiencies; secret key generation rate; secret keys; writing efficiencies; Detectors; Photodetectors; Photonics; Probabilistic logic; Protocols; Quantum entanglement; Repeaters; Long-distance quantum cryptography; quantum key distribution; quantum networks; quantum networs; quantum repeaters;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2014.2364129