DocumentCode :
400450
Title :
Versatile high-level synthesis of self-checking datapaths using an on-line testability metric
Author :
Oikonomakos, Petros ; Zwolinski, Mark ; Al-Hashimi, Bashir M.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fYear :
2003
fDate :
2003
Firstpage :
596
Lastpage :
601
Abstract :
There have been several recent attempts to include duplication-based on-line testability in behaviourally synthesized designs. In this paper, on-line testability is considered within the optimisation process of iterative, cost function-driven high-level synthesis, such that on-line testing resources are inserted automatically without any modification of the source HDL code. This involves the introduction of a metric for on-line testability. A variation of duplication testing (namely inversion testing) is also used, providing the system with an additional degree of freedom towards minimising hardware overheads associated with test resource insertion. Considering on-line testability within the synthesis process facilitates fast and efficient design space exploration, resulting in a versatile high-level synthesis process, capable of producing alternative realisations according to the designer´s directions.
Keywords :
built-in self test; circuit optimisation; data flow graphs; design for testability; hardware description languages; high level synthesis; iterative methods; logic testing; HDL; cost function-driven synthesis; dataflow graphs; duplication-based on-line testability; inversion testing; iterative synthesis; on-line testability metric; optimisation; self-checking datapaths; test resource insertion; versatile high-level synthesis; Adders; Algorithm design and analysis; Automatic testing; Circuit faults; Computer science; Electronic equipment testing; Hardware design languages; High level synthesis; Redundancy; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253673
Filename :
1253673
Link To Document :
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