DocumentCode :
400453
Title :
Multi-granularity metrics for the era of strongly personalized SOCs
Author :
Moullec, Y. Le ; Amor, N. Ben ; Diguet, J-Ph ; Abid, M. ; Philippe, J.-L.
Author_Institution :
Univ. de Bretagne Sud, Lorient, France
fYear :
2003
fDate :
2003
Firstpage :
674
Lastpage :
679
Abstract :
This paper details the first step of the Design Trotter framework for design space exploration applied to dedicated SOCs. The aim of this step is to provide metrics in order to guide the designer and the synthesis tool towards an efficient application architecture matching. This work presents a computation of metrics at all levels of the application graph-based hierarchy. These metrics are computed through data and control dependency analysis. They quantify the memory, control and processing orientations as well as the average of parallelism for different granularities.
Keywords :
circuit CAD; circuit optimisation; graph theory; integrated circuit design; system-on-chip; Design Trotter framework; application architecture matching; application graph-based hierarchy; control dependency analysis; design space exploration; multi-granularity metrics; parallelism; processing orientations; strongly personalized SOCs; synthesis tool; Bandwidth; Clocks; Communication channels; Design optimization; Frequency; Hardware; Parallel processing; Pipelines; Process control; Space exploration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253685
Filename :
1253685
Link To Document :
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