Title :
Efficient generation of monitor circuits for GSTE assertion graphs
Author :
Hu, Alan J. ; Cases, J. ; Yang, Jin
Author_Institution :
Dept. of Comput. Sci., British Columbia Univ., Vancouver, BC, Canada
Abstract :
Generalized symbolic trajectory evaluation (GSTE) is a powerful, new method for formal verification that combines the industrially-proven scalability and capacity of classical symbolic trajectory evaluation with the expressive power of temporal-logic model checking. GSTE was originally developed at Intel and has been used successfully on Intel\´s next-generation microprocessors. However, the supporting algorithms and tools for GSTE are still relatively immature. GSTE specifications are given as assertion graphs, an extension of /spl forall/-automata. This paper presents a linear-time, linear-size translation from GSTE assertion graphs into monitor circuits, which can be used with dynamic verification both as a quick "sanity check" of the specification before effort is invested in abstraction and formal verification, and also as means to reuse GSTE specifications with other validations methods. We present experimental results using real GSTE assertion graphs for real industrial circuits, showing that the circuit construction procedure is efficient in practice and that the monitor circuits impose minimal simulation overhead.
Keywords :
circuit simulation; formal specification; formal verification; logic testing; temporal logic; GSTE assertion graphs; GSTE specifications; circuit construction; dynamic verification; formal verification; generalized symbolic trajectory evaluation; industrial circuits; linear size translation; microprocessor; monitor circuit generation; sanity check; scalability; temporal logic model checking; Circuit simulation; Circuit testing; Computer industry; Computer science; Computerized monitoring; Construction industry; Formal verification; Microprocessors; Permission; Scalability;
Conference_Titel :
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-762-1
DOI :
10.1109/ICCAD.2003.159685