Title :
SATORI-a fast sequential SAT engine for circuits
Author :
Iyer, M.K. ; Parthasarathy, G. ; Cheng, K.-T.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
We describe the design and implementation of SATORI-a fast sequential justification engine based on state-of-the-art SAT and ATPG techniques. We present several novel techniques that propel SATORI to a demonstrable 10x improvement over a commercial engine. Traditional sequential justification based on ATPG or, on a bounded model of the sequential circuit using SAT, has diverging strengths and weaknesses. In this paper, we contrast these techniques and describe how their-strengths are combined in SATORI. We use conflict-based learning in each time-frame and illegal state learning across time-frames. This enables both combinational and sequential back-jumping. We experimentally analyze the main features of SATORI by comparing SATORI´S performance against a state-of-the-art SAT solver-ZCHAFF using a bounded model, and a commercial sequential ATPG engine performing justification. Additional results are presented for SATORI versus the commercial ATPG engine and VIS on ISCAS ´89 and ITC´99 benchmark circuits for an application to assertion checking.
Keywords :
automatic test pattern generation; backtracking; computability; sequential circuits; ATPG techniques; ISCAS 89 benchmark circuits; ITC 99 benchmark circuits; SATORI; VIS; ZCHAFF; assertion checking; automatic test pattern generation; combinational back jumping; commercial sequential ATPG engine; conflict based learning; fast sequential SAT engine; fast sequential justification engine; satisfiability; sequential back jumping; sequential circuit; state of the art SAT solver; Automatic test pattern generation; Circuit faults; Circuit synthesis; Circuit testing; Engines; Logic testing; Permission; Propulsion; Sequential circuits; State-space methods;
Conference_Titel :
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-762-1
DOI :
10.1109/ICCAD.2003.159706