DocumentCode
400763
Title
Circuit simulation of nanotechnology devices with non-monotonic I-V characteristics
Author
Le, Jiayong ; Pileggi, L. ; Devgan, Amudh
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2003
fDate
9-13 Nov. 2003
Firstpage
491
Lastpage
496
Abstract
As research begins to explore potential nanotechnologies for future post-CMOS integrated systems, modeling and simulation environments must be developed that can accommodate the corresponding problem complexity and non-traditional device characteristics. This paper describes a circuit-level simulator that can accommodate an important class of nanotechnology devices that are characterized by nonmonotonic I-V characteristics. Employing adaptively controlled explicit integration method (ACES) and piecewise linear (PWL) device models, the proposed approach effectively overcomes the convergence problems and multiple equilibrium point solution problems caused by the Negative Differential Resistance (NDR) regions in such device I-V functions. Importantly, the ACES approach can address the circuit size problem when partitioning is included, and provide compatibility with simple I-V device model tables, thereby avoiding the need for analytical device models that rarely are available for nanotechnology devices.
Keywords
CMOS integrated circuits; adaptive control; circuit simulation; convergence; integrated circuit modelling; nanotechnology; piecewise linear techniques; ACES method; CMOS integrated systems; NDR regions; PWL device models; adaptively controlled explicit integration method; circuit level simulator; circuit simulation; convergence problems; integrated system modelling; multiple equilibrium point solution problems; nanotechnology devices; negative differential resistance regions; nonmonotonic I-V characteristics; piecewise linear device models; Analytical models; Circuit analysis; Circuit simulation; Convergence; Integrated circuit technology; Nanoelectronics; Nanotechnology; Permission; Piecewise linear techniques; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location
San Jose, CA, USA
Print_ISBN
1-58113-762-1
Type
conf
DOI
10.1109/ICCAD.2003.159729
Filename
1257856
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