DocumentCode :
400763
Title :
Circuit simulation of nanotechnology devices with non-monotonic I-V characteristics
Author :
Le, Jiayong ; Pileggi, L. ; Devgan, Amudh
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2003
fDate :
9-13 Nov. 2003
Firstpage :
491
Lastpage :
496
Abstract :
As research begins to explore potential nanotechnologies for future post-CMOS integrated systems, modeling and simulation environments must be developed that can accommodate the corresponding problem complexity and non-traditional device characteristics. This paper describes a circuit-level simulator that can accommodate an important class of nanotechnology devices that are characterized by nonmonotonic I-V characteristics. Employing adaptively controlled explicit integration method (ACES) and piecewise linear (PWL) device models, the proposed approach effectively overcomes the convergence problems and multiple equilibrium point solution problems caused by the Negative Differential Resistance (NDR) regions in such device I-V functions. Importantly, the ACES approach can address the circuit size problem when partitioning is included, and provide compatibility with simple I-V device model tables, thereby avoiding the need for analytical device models that rarely are available for nanotechnology devices.
Keywords :
CMOS integrated circuits; adaptive control; circuit simulation; convergence; integrated circuit modelling; nanotechnology; piecewise linear techniques; ACES method; CMOS integrated systems; NDR regions; PWL device models; adaptively controlled explicit integration method; circuit level simulator; circuit simulation; convergence problems; integrated system modelling; multiple equilibrium point solution problems; nanotechnology devices; negative differential resistance regions; nonmonotonic I-V characteristics; piecewise linear device models; Analytical models; Circuit analysis; Circuit simulation; Convergence; Integrated circuit technology; Nanoelectronics; Nanotechnology; Permission; Piecewise linear techniques; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-762-1
Type :
conf
DOI :
10.1109/ICCAD.2003.159729
Filename :
1257856
Link To Document :
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