DocumentCode :
400797
Title :
SuPREME: substrate and power-delivery reluctance-enhanced macromodel evaluation
Author :
Tsung-Hao Chen ; Luk, Clement ; Chen, Tsung-Hao
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
2003
fDate :
9-13 Nov. 2003
Firstpage :
786
Lastpage :
792
Abstract :
The recent demand for system-on-chip RF mixed-signal design and aggressive supply-voltage reduction require chip-level accurate analysis of both the substrate and power delivery systems. Together with the rising frequency, low-k dielectric, copper interconnects, and high conductivity substrate, the inductance effects raised serious concern recently. However, the increasing design complexity creates tremendous challenges for chip-level power-delivery substrate co-analysis. In this paper, we propose a novel and efficient reluctance-based passive model order reduction technique to serve these tasks. Our work, SuPREME(Substrate and Power-delivery Reluctance-Enhanced Macromodel Evaluation) not only greatly reduces the computational complexity of previous reluctance-based model order algorithms but is also capable of handling large number of noise sources efficiently. To facilitate the analysis of inductive substrate return paths and evaluate the high-frequency substrate coupling effects, we derive a novel RLKC substrate model from Maxwell´s equations for the first time. Experimental results demonstrate the superior runtime and accuracy of SuPREME compared to the traditional MNA-based simulation.
Keywords :
Maxwell equations; digital simulation; matrix algebra; power systems; reduced order systems; substrates; system-on-chip; MNA based simulation; Maxwell equations; RLKC substrate model; SuPREME; chip level power delivery substrate coanalysis; computational complexity; frequency substrate coupling effects; inductance effects; matrix algebra; modified nodal analysis based simulation; power delivery systems; reluctance based passive model order reduction technique; substrate and power delivery reluctance enhanced macromodel evaluation; supply voltage reduction; system-on-chip RF mixed signal design; Computational complexity; Conductivity; Copper; Dielectric substrates; Inductance; Noise reduction; Power system interconnection; Power system modeling; Radio frequency; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-762-1
Type :
conf
DOI :
10.1109/ICCAD.2003.159766
Filename :
1257898
Link To Document :
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