Title :
Precision halo control with antimony and indium on Axcelis medium current ion implanters
Author :
Luckman, G. ; Harris, Matthew W. ; Rathmell, R.D. ; Kopalidis, P. ; Ray, A.M. ; Sato, Fumiaki ; Sano, Makoto
Abstract :
Heavy ions such as indium and antimony are increasingly being used for high tilt angle halo implants needed for control of short channel effects in advanced CMOS devices. Precise angular control of these implants is required, especially when masking due to high tilt shadowing can occur, or when device geometry requires an implant at a channeling condition. This paper will describe the antimony and indium process performance of Axcelis Technologies´ medium current serial implanters, the 8250HT and the MC3. Parallelism and angular control data, uniformity results, and throughput versus energy for antimony and indium implants are presented.
Keywords :
CMOS integrated circuits; antimony; indium; ion implantation; semiconductor doping; Axcelis medium current ion implanters; In; Sb; advanced CMOS devices; device geometry; high tilt angle halo implants; high tilt shadowing; masking; precision halo control; short channel effects; CMOS technology; Electrostatic measurements; Fabrication; Geometry; Implants; Indium; Lenses; Magnetic separation; Shadow mapping; Throughput;
Conference_Titel :
Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on
Conference_Location :
Taos, New Mexico, USA
Print_ISBN :
0-7803-7155-0
DOI :
10.1109/IIT.2002.1257993