• DocumentCode
    400899
  • Title

    Water cooled plasma flood source for intense ion beam implantation

  • Author

    Zhimin Wan ; Linuan Chen, Linuan Chen ; Jiong Chen

  • fYear
    2002
  • fDate
    27-27 Sept. 2002
  • Firstpage
    432
  • Lastpage
    435
  • Abstract
    A plasma shower for ion beam and process wafer neutralization has been developed. A plasma is produced within an arc discharge chamber enclosed in a source housing with sufficient water cooling so that the housing temperature is close to room temperature. Arc discharge between a filament and the arc chamber ionizes the shower gas atoms or molecules in the are chamber. The low energy electrons together with ions in the plasma drift out of the arc chamber and neutralize the ion beams and the process wafers. The sufficiently cooled source housing prevents radiation to the process wafers and reduces vapor pressures of variety of elements in the arc chamber. Therefore, metal contaminations resulting from the shower operations are very low on the process wafers. The low temperature of the arc chamber reduces the gas leakage rate per unit area from the arc chamber by a factor of ∼2. In this way, the beamline pressure can be kept low while more electrons can be extracted from the plasma source through the apertures with a larger area.
  • Keywords
    ion sources; plasma sources; semiconductor doping; arc discharge chamber; beamline pressure; filament; gas molecules; intense ion beam implantation; ion beam wafer neutralization; low energy electrons; plasma drift; plasma shower; process wafer neutralization; shower gas atoms; water cooled plasma flood source; Arc discharges; Atomic measurements; Contamination; Cooling; Electron beams; Floods; Ion beams; Plasma sources; Plasma temperature; Water resources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on
  • Conference_Location
    Taos, New Mexico, USA
  • Print_ISBN
    0-7803-7155-0
  • Type

    conf

  • DOI
    10.1109/IIT.2002.1258033
  • Filename
    1258033