Title :
Implant energy determination from time-of-flight measurement
Author :
Scherer, E. ; Wenzel, K.W.
Abstract :
High-energy ion implanters using RF acceleration have advantages over electrostatic implementations. However, beam energy from such systems is not simply related to DC voltages as it is in electrostatic systems. Traditionally, energy control in these machines relies on beam collimation from a final energy magnet. Axcelis has developed a novel approach that calculates the energy from the time delay of pulses generated by two spatially separated beam current probes. The compact and cost-effective design is based on a precision, programmable delay line and a unique pulse correlation technique. The prototype hardware has yielded a delay resolution and repeatability of better than ±100 picoseconds. Absolute energy calibration of the system is established through a nuclear interaction measurement. This patented Time-of-Flight (TOF) methodology has demonstrated the potential for <1.0 % measurement accuracy.
Keywords :
calibration; ion implantation; process control; Axcelis; DC voltages; RF acceleration; beam collimation; beam energy; delay resolution; design; electrostatic implementations; energy calibration; energy control; final energy magnet; hardware; high-energy ion implanters; implant energy determination; measurement accuracy; nuclear Interaction measurement; programmable delay line; pulse correlation technique; pulse time delay; repeatability; time-of-flight measurement; Acceleration; Collimators; Delay effects; Electrostatic measurements; Energy measurement; Implants; Magnetic separation; Pulse generation; Radio frequency; Voltage;
Conference_Titel :
Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on
Conference_Location :
Taos, New Mexico, USA
Print_ISBN :
0-7803-7155-0
DOI :
10.1109/IIT.2002.1258055