DocumentCode :
400949
Title :
Evolution of the local Fe environment in high temperature implanted InP
Author :
Gasparotto, A. ; Cesca, T. ; Mattei, G. ; Rampazzo, V. ; Priolo, Francesco ; Moreira, Edmilson C. ; Bocchi, C. ; Fraboni, B. ; Boscherini, F. ; Ciatto, G. ; D´Acapito, F.
fYear :
2002
fDate :
27-27 Sept. 2002
Firstpage :
657
Lastpage :
660
Abstract :
High temperature ion implantation of Fe in InP has been investigated to understand how the final lattice position of iron atoms is influenced by the implantation and annealing conditions. A high degree of substitutionality is obtained thanks to dynamical annealing, during implantation, of the damage. It is found that point defect fluxes during high temperature annealing control the kick-out of Fe from substitutional sites, leading to the formation of Fe-P complexes. However, the electrically active Fe fraction is still in the 1018 cm-3 range, and full compensation of initially n+ doped materials can be obtained.
Keywords :
III-V semiconductors; annealing; doping profiles; indium compounds; interstitials; ion implantation; iron; semiconductor doping; InP:Fe; annealing conditions; dynamical annealing; final lattice position; high temperature implanted InP; implantation conditions; local Fe environment; point defect fluxes; Annealing; Atom optics; Impurities; Indium phosphide; Ion implantation; Iron; Lattices; Physics; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on
Conference_Location :
Taos, New Mexico, USA
Print_ISBN :
0-7803-7155-0
Type :
conf
DOI :
10.1109/IIT.2002.1258091
Filename :
1258091
Link To Document :
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