Title :
Rate-compatible punctured serial concatenated convolutional codes
Author :
Babich, Fulvio ; Montorsi, Guido ; Vatta, Francesca
Author_Institution :
DEEI, Trieste Univ., Italy
Abstract :
We propose and compare some good rate-compatible serial concatenated convolutional code (SCCC) families. To obtain rate-compatible SCCCs, the puncturing is limited to inner coded bits. However, and this is the novelty proposed, we do not limit the puncturing to inner parity bits only, but we extend it also to inner systematic bits, thus obtaining higher rate SCCCs (i.e., beyond the outer code rate). The two main applications of this technique are its use in hybrid ARQ/FEC schemes and to achieve unequal error protection (UEP) of an information sequence.
Keywords :
automatic repeat request; concatenated codes; convolutional codes; forward error correction; UEP; concatenated codes; hybrid ARQ/FEC schemes; inner parity bits; inner systematic bits; outer code rate; punctured serial concatenated convolutional codes; rate-compatible SCCC; rate-compatible serial concatenated convolutional codes; unequal error protection; Automatic repeat request; Concatenated codes; Convolutional codes; Decoding; Error correction codes; Floors; Forward error correction; Proposals; Signal to noise ratio;
Conference_Titel :
Global Telecommunications Conference, 2003. GLOBECOM '03. IEEE
Print_ISBN :
0-7803-7974-8
DOI :
10.1109/GLOCOM.2003.1258599