Title :
Magnetic and FMR Study on CoFe2O4/ZnFe2O4 Bilayers
Author :
Sahu, B.N. ; Sahoo, S.C. ; Venkataramani, N. ; Prasad, Santasriya ; Krishnan, Ram ; Kostylev, Mikhail ; Stamps, R.L.
Author_Institution :
Dept. of Phys., Indian Inst. of Technol., Mumbai, Mumbai, India
Abstract :
CoFe2O4/ZnFe2O4 bilayers were deposited by the pulsed laser deposition on amorphous fused quartz substrate at substrate temperature of 350°C and in oxygen pressure of 0.16 mbar. The films were studied after ex-situ annealing for 2 h in air at various temperatures up to 650°C. The magnetic properties of the bilayers were studied at 300 K and at 10 K. Ferromagnetic resonance was carried out at x-band frequencies at room temperature. It was found that as a result of annealing, the diffusion between Co ferrite and Zn ferrite starts around 350°C and leads to a large line width system having magnetization, which remains undetected by Ferromagnetic resonance.
Keywords :
annealing; cobalt compounds; ferrites; ferromagnetic resonance; interface magnetism; magnetisation; pulsed laser deposition; zinc compounds; CoFe2O4-ZnFe2O4; FMR analysis; SiO2; amorphous fused quartz substrate; annealing; diffusion; ferrite; ferromagnetic resonance; magnetic bilayers; magnetization; pressure 0.16 mbar; pulsed laser deposition; temperature 10 K; temperature 293 K to 298 K; temperature 300 K; temperature 350 degC; time 2 h; x-band frequencies; Annealing; Ferrites; Magnetic properties; Magnetic resonance; Magnetization; Substrates; Temperature measurement; Bilayer; ferrite thin films; ferromagnetic resonance;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2013.2251327
