• DocumentCode
    402071
  • Title

    Embedded test for low cost manufacturing

  • Author

    Rajski, Janusz ; Tyszer, Jerzy ; Mukherjee, Nilanjan ; Rinderknecht, Thomas

  • Author_Institution
    Design Verification & Test Div., Mentor Graphics Corp., Wilsonville, OR, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    21
  • Lastpage
    23
  • Abstract
    This paper presents state-of -the-art embedded test technology, practices, and automation tools for high-quality low cost manufacturing test. Embedded test structures are focused and pseudo random versus deterministic forms are compared. This paper covers new embedded test methodologies based on deterministic patterns, such as LFSR reseeding, OPMISR, Smart BIST, and embedded deterministic test.
  • Keywords
    automatic test equipment; built-in self test; logic testing; BIST; LFSR reseeding; automation tools; built in self test; embedded test; high quality low cost manufacturing test; linear feedback shift register; Automatic testing; Circuit faults; Circuit testing; Costs; Design engineering; Geometry; Graphics; Manufacturing; Routing; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2004. Proceedings. 17th International Conference on
  • Print_ISBN
    0-7695-2072-3
  • Type

    conf

  • DOI
    10.1109/ICVD.2004.1260896
  • Filename
    1260896
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=402071