Title :
Embedded test for low cost manufacturing
Author :
Rajski, Janusz ; Tyszer, Jerzy ; Mukherjee, Nilanjan ; Rinderknecht, Thomas
Author_Institution :
Design Verification & Test Div., Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
This paper presents state-of -the-art embedded test technology, practices, and automation tools for high-quality low cost manufacturing test. Embedded test structures are focused and pseudo random versus deterministic forms are compared. This paper covers new embedded test methodologies based on deterministic patterns, such as LFSR reseeding, OPMISR, Smart BIST, and embedded deterministic test.
Keywords :
automatic test equipment; built-in self test; logic testing; BIST; LFSR reseeding; automation tools; built in self test; embedded test; high quality low cost manufacturing test; linear feedback shift register; Automatic testing; Circuit faults; Circuit testing; Costs; Design engineering; Geometry; Graphics; Manufacturing; Routing; Sequential analysis;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1260896
