• DocumentCode
    402073
  • Title

    CMOS scaling for sub-90 nm to sub-10 nm

  • Author

    Iwai, Hiroshi

  • Author_Institution
    Frontier Collaborative Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    30
  • Lastpage
    35
  • Abstract
    Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
  • Keywords
    CMOS integrated circuits; MOSFET; large scale integration; 10 nm; 6 nm; 90 nm; CMOS LSI; CMOS downscaling; complementary metal oxide semiconductor; large scale integrated circuits; metal oxide semiconductor field effect transistor; p-channel MOSFET; transistor operation; Acceleration; CMOS integrated circuits; CMOS technology; Consumer electronics; Electronic circuits; Humans; Integrated circuit technology; Large scale integration; MOSFET circuits; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2004. Proceedings. 17th International Conference on
  • Print_ISBN
    0-7695-2072-3
  • Type

    conf

  • DOI
    10.1109/ICVD.2004.1260899
  • Filename
    1260899