DocumentCode
402073
Title
CMOS scaling for sub-90 nm to sub-10 nm
Author
Iwai, Hiroshi
Author_Institution
Frontier Collaborative Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
fYear
2004
fDate
2004
Firstpage
30
Lastpage
35
Abstract
Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
Keywords
CMOS integrated circuits; MOSFET; large scale integration; 10 nm; 6 nm; 90 nm; CMOS LSI; CMOS downscaling; complementary metal oxide semiconductor; large scale integrated circuits; metal oxide semiconductor field effect transistor; p-channel MOSFET; transistor operation; Acceleration; CMOS integrated circuits; CMOS technology; Consumer electronics; Electronic circuits; Humans; Integrated circuit technology; Large scale integration; MOSFET circuits; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN
0-7695-2072-3
Type
conf
DOI
10.1109/ICVD.2004.1260899
Filename
1260899
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