• DocumentCode
    402110
  • Title

    Comparison of effectiveness of Current Ratio and Delta-IDDQ tests

  • Author

    Sabade, Sagar S. ; Walker, D.M.H.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    889
  • Lastpage
    894
  • Abstract
    IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of IDDQ test are Current Ratio and Delta-IDDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.
  • Keywords
    leakage currents; semiconductor device testing; current ratio; deep submicron technology; defects detection; delta-IDDQ test; industrial test data; semiconductor manufacturers; Chromium; Circuit faults; Histograms; Large scale integration; Leakage current; Logic testing; Production; Semiconductor device measurement; Sensitivity analysis; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2004. Proceedings. 17th International Conference on
  • Print_ISBN
    0-7695-2072-3
  • Type

    conf

  • DOI
    10.1109/ICVD.2004.1261043
  • Filename
    1261043
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=402110