Dielectric parameters study using a waveguide cavity and a rigorous processing algorithm

Author

Ermak, G. ; Poyedinchuk, Anatoliy ; Varavin, Anton ; Yashina, Nataliya

Author_Institution

Inst. for Radiophys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkov, Ukraine

Volume

2

fYear

2003

fDate

7-9 Oct. 2003

Firstpage

751

Abstract

The measurements of permittivity of various dielectrics are one of "long time keeping attention problem" according to K. P. Takur and W. S. Holmes (2001), G. P. Ermak et al. (2002) and A. Ye. Poyedinchuk and N. P. Yashina (2001). The millimetre-wave vector network analyzer and algorithm, comprising the semi-analytical rigorous solution of direct and numerical solution of inverse problem are developed according to G. P. Ermak et al. (2002) and A. Ye. Poyedinchuk and N. P. Yashina (2001). The waveguide chamber with dielectric placed inside is considered as a principal element of the experimental set. The abilities and capacity of measuring devise supplied with processing algorithms are described in the presentation.

Keywords

dielectric properties; network analysers; permittivity measurement; waveguides; dielectric parameters; direct solution; inverse problem; millimetre-wave vector network analyzer; numerical solution; permittivity measurements; rigorous processing algorithm; waveguide cavity; waveguide chamber; Dielectric measurements; Diffraction; Electromagnetic measurements; Electromagnetic waveguides; Equations; Frequency; Integrated circuit modeling; Inverse problems; Permittivity measurement; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2003. 33rd European

Print_ISBN

1-58053-834-7

Type

conf

DOI

10.1109/EUMC.2003.1262999

Filename

1262999