Dielectric parameters study using a waveguide cavity and a rigorous processing algorithm

The measurements of permittivity of various dielectrics are one of "long time keeping attention problem" according to K. P. Takur and W. S. Holmes (2001), G. P. Ermak et al. (2002) and A. Ye. Poyedinchuk and N. P. Yashina (2001). The millimetre-wave vector network analyzer and algorithm, comprising the semi-analytical rigorous solution of direct and numerical solution of inverse problem are developed according to G. P. Ermak et al. (2002) and A. Ye. Poyedinchuk and N. P. Yashina (2001). The waveguide chamber with dielectric placed inside is considered as a principal element of the experimental set. The abilities and capacity of measuring devise supplied with processing algorithms are described in the presentation.