DocumentCode
4025
Title
Gate-Induced Source Tunneling FET (GISTFET)
Author
Pan, Andrew ; Chi On Chui
Author_Institution
Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA, USA
Volume
62
Issue
8
fYear
2015
fDate
Aug. 2015
Firstpage
2390
Lastpage
2395
Abstract
We propose a device, the gate-induced source tunneling FET (GISTFET), that uses two gate work functions to modulate lateral tunneling. The performance of the device is largely independent of the details of the chemical doping profile, potentially freeing device design from issues related to solid solubility, junction abruptness, and dopant variability. We demonstrate the advantages of the device over conventional TFETs using ballistic quantum transport simulations and discuss the possible role of scattering. The proposed device can be used to make all types of tunneling devices, but is particularly important for enabling steep swing, high current p-type transistors.
Keywords
ballistic transport; semiconductor device models; semiconductor doping; tunnel transistors; GISTFET; ballistic quantum transport simulations; chemical doping profile; device design; dopant variability; gate work functions; gate-induced source tunneling FET; junction abruptness; lateral tunneling; p-type transistors; solid solubility; tunneling devices; Doping; Junctions; Logic gates; Metals; Transistors; Tunneling; Interband tunneling; metal gate; metal work function (WF); nonequilibrium green’s function (NEGF); nonequilibrium green???s function (NEGF); tunneling FET (TFET); tunneling FET (TFET).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2445343
Filename
7150407
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