Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding

Author

Changwook Yoon ; Tsiklauri, Mikheil ; Zvonkin, Mikhail ; Chen, Qinghua Bill ; Razmadze, Alexander ; Aflaki, Aman ; Jingook Kim ; Jun Fan ; Drewniak, James L.

Author_Institution

Altera Corp., San Jose, CA, USA

Volume

57

Issue

4

fYear

2015

fDate

Aug. 2015

Firstpage

836

Lastpage

846

Abstract

Time-domain channel characterization (TCC) for de-embedding of an asymmetric fixture is introduced. Two design criteria for the design of a 2x-thru are proposed. Error sensitivity regarding a small error in the S-parameters of the 1x-fixture is analyzed with an insertion loss error-coefficient and a return loss error-coefficient. The TCC procedure, including proposed design criteria and error sensitivity, is also introduced to reduce the error in the TCC application. Three different 2x-thru structures are investigated for the verification of the two proposed design criteria and analyzed for error sensitivity. Test fixtures on a printed circuit boards are fabricated for the experimental verification.

Keywords

S-parameters; fixtures; printed circuit manufacture; time-domain analysis; 2x-thru structure; TCC; asymmetry fixture deembedding; error sensitivity; insertion loss error-coefficient; printed circuit board fabrication; return loss error-coefficient; time-domain channel characterization; Calibration; Impedance; Integrated circuit modeling; Mirrors; Scattering parameters; Sensitivity; Time-domain analysis; De-embedding; design criteria; error sensitivity; error-coefficient; insertion loss error-coefficient (ILEC); return loss error-coefficient (RLEC); time-domain channel characterization (TCC);

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2014.2379627

Filename

7194924