Title :
Optimization problems in periodic and disordered dielectrical structures
Author :
Gersen, Henkjan ; Klunder, D.J.W. ; Korterik, J.P. ; Driessen, A. ; van Hulst, Niek F. ; Kuipers, L.
Author_Institution :
Twente Univ., Enschede, Netherlands
fDate :
29 June-3 July 2003
Abstract :
Summary form only given. As demands on the speed of integrated optical devices increase, ever-shorter light pulses will be used in those devices. As the development of the photonic devices advances, so to will the need to monitor the behavior of short pulses as they propagate through such devices. However, peeking inside a photonic structure is far from trivial as conventional microscopy is limited by the diffraction limit. Recently, we demonstrated a non-invasive technique based on an optical photon scanning tunneling microscope (PSTM) that can be used to "visualize" pulses as they propagate through an optical device with both temporal and spatial resolution. With this technique we have now been able to observe the time-resolved motion of a short optical wave packet.
Keywords :
dielectric properties; high-speed optical techniques; inhomogeneous media; integrated optics; optical testing; optimisation; scanning probe microscopy; scanning tunnelling microscopy; diffraction limit; disordered dielectrical structures; integrated optical devices; light pulses; noninvasive technique; optical photon scanning tunneling microscope; optimization; periodic dielectrical structures; photonic devices; photonic structure; short optical wave packet; spatial resolution; temporal resolution; time-resolved motion; Dielectrics; Monitoring; Optical devices; Optical diffraction; Optical microscopy; Optical propagation; Optical pulses; Periodic structures; Tunneling; Visualization;
Conference_Titel :
Transparent Optical Networks, 2003. Proceedings of 2003 5th International Conference on
Print_ISBN :
0-7803-7816-4
DOI :
10.1109/ICTON.2003.1264591
