Title :
Optical-Time-Division Demultiplexing of 172 Gb/s to 43 Gb/s in a-Si:H Waveguides
Author :
Suda, Seiichi ; Tanizawa, Ken ; Kurosu, Takayuki ; Kamei, Toshihiro ; Sakakibara, Y. ; Takei, Ryohei ; Mori, Marco ; Kawashima, Hitoshi ; Namiki, Shu
Author_Institution :
Photonics Res. Inst., Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Abstract :
We demonstrate optical-time-division demultiplexing of 172-43 Gb/s based on degenerate four-wave mixing in a 17-mm-long hydrogenated amorphous silicon (a-Si:H) wire waveguide. The a-Si:H wire waveguide has a record-low propagation loss of 1.0 dB/cm and a low two-photon-absorption loss of 0.2 cm/GW, and the nonlinear figure of merit is estimated to be 0.97, which is more than twice as effective as conventional crystalline silicon wire waveguides. We achieved successful error-free demultiplexing with an ON/OFF conversion efficiency of -10 dB and a power penalty of only 1.1 dB at a bit error rate of 10-9. No optical damage to the a-Si:H waveguide was observed even after a continuous pump injection at an average power of several tens of mW for a couple of hours.
Keywords :
amorphous semiconductors; demultiplexing; elemental semiconductors; error statistics; hydrogen; multiwave mixing; optical information processing; optical losses; optical waveguides; silicon compounds; two-photon spectroscopy; ON-OFF conversion efficiency; Si:H; a-Si:H waveguides; bit error rate; bit rate 43 Gbit/s to 172 Gbit/s; continuous pump injection; crystalline silicon wire waveguides; degenerate four wave mixing; error-free demultiplexing; hydrogenated amorphous silicon wire waveguide; optical time-division demultiplexing; propagation loss; size 17 mm; two-photon-absorption loss; Adaptive optics; Nonlinear optics; Optical amplifiers; Optical pulses; Optical pumping; Optical waveguides; Optical wavelength conversion; Amorphous silicon waveguide; four-wave mixing; optical demultiplexing; optical gating; optical signal processing; optical switch;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2013.2294954