• DocumentCode
    403481
  • Title

    A 2.7V 350μW 11-b algorithmic analogue-to-digital converter with single-ended multiplexed inputs

  • Author

    Nagari, Angelo ; Nicollini, Germano

  • Author_Institution
    STMicroelectronics, Agrate Brianza, Italy
  • Volume
    1
  • fYear
    2004
  • fDate
    16-20 Feb. 2004
  • Firstpage
    76
  • Abstract
    A low-power low-area CMOS algorithmic A/D converter that does not require trimming nor digital calibration is presented. The topology is based on a classical cyclic A/D conversion using a capacitor ratio-independent computation circuitry. All the nonidealities have been carefully analyzed and reduced by proper choices of design and layout solutions. As a result the errors coming from opamp offset and finite open-loop dc gain, switch charge injection and clock feedthrough, parasitic capacitors, and intrinsic noise sources are reduced under the LSB level. To process a multiplexed (8 channels) single-ended analogue input, an efficient single-ended to fully differential circuit has been presented. The converter achieves 11 bit accuracy in the Nyquist band at a sampling rate of 8kSps. The total power dissipation is only 350μW at 2.7V supply voltage. The active area is 0.3 mm2 in a 0.35 μm 5 metal levels CMOS technology with double-poly linear capacitors.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; low-power electronics; mixed analogue-digital integrated circuits; 0.35 micron; 11-b algorithmic converter; 2.7 V; 350E-6 W; CMOS technology; LSB level; Nyquist band; algorithmic A/D converter; analogue-to-digital converter; capacitor ratio-independent computation circuitry; clock feedthrough; differential circuit; double-poly linear capacitors; finite open-loop dc gain; intrinsic noise sources; low-area CMOS; low-power CMOS; multiplexed analogue input; opamp offset; parasitic capacitors; single-ended analogue input; single-ended multiplexed inputs; switch charge injection; CMOS technology; Calibration; Circuit noise; Circuit topology; Clocks; Noise level; Noise reduction; Sampling methods; Switched capacitor circuits; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2085-5
  • Type

    conf

  • DOI
    10.1109/DATE.2004.1268830
  • Filename
    1268830