Title :
Graph-based functional test program generation for pipelined processors
Author :
Mishra, Prabhat ; Dutt, Nikil
Author_Institution :
Center for Embedded Comput. Syst., California Univ., Irvine, CA, USA
Abstract :
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has proposed several promising ideas, many challenges remain in applying them to realistic embedded processors. We present a graph coverage based functional test program generation approach for pipelined processors. The proposed methodology makes three important contributions. First, it automatically generates the graph model of the pipelined processor from the specification using functional abstraction. Second, it generates functional test programs based on the coverage of the pipeline behaviour. Finally, the test generation time is drastically reduced due to the use of module level property checking. We applied this methodology on the DLX processor to demonstrate the usefulness of our approach.
Keywords :
automatic test pattern generation; formal verification; integrated circuit design; microprocessor chips; pipeline processing; DLX processor; embedded processors; functional abstraction; functional verification; graph-based functional test program generation; microprocessor design; pipeline behaviour; pipelined processors; test generation time; Architecture description languages; Automatic testing; Computer architecture; Decoding; Design methodology; Embedded computing; Embedded system; Microprocessors; Pipelines; System performance;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268846