Title :
Random jitter extraction technique in a multi-gigahertz signal
Author :
Ong, Chee-Kian ; Hong, Dongwoo ; Cheng, Kwang-Ting ; Wang, Li-C
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
In this paper, we propose a simple technique for estimating the standard deviation of a Gaussian random jitter component in a multi-gigahertz signal. This method may utilize existing on-chip single-shot period measurement techniques to measure the multi-gigahertz signal periods for the estimation. This method does not require an external sampling clock, or any additional measurement beyond existing techniques. Experimental results show that this extraction method can accurately estimate the random jitter variance in a multi-gigahertz signal even with the presence of a few hundred-hertz sinusoidal jitter components.
Keywords :
Gaussian processes; estimation theory; jitter; random processes; signal processing; Gaussian random jitter; multigigahertz signal; on-chip single-shot period measurement; random jitter extraction; sampling clock; sinusoidal jitter; Clocks; Jitter; Radio frequency; Reliability engineering; Signal analysis; Signal processing; Spectral analysis; System performance; Testing; Timing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268862