DocumentCode
403507
Title
A method for parameter extraction of analogue sine-wave signals for mixed-signal built-in-self-test applications
Author
Vázquez, Diego ; Leger, Gildas ; Huertas, Gloria ; Rueda, Adoración ; Huertas, José L.
Author_Institution
Instituto de Microelectron. de Sevilla, Univ. de Sevilla, Spain
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
298
Abstract
This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analogue sine-wave signal. The required circuitry for on-chip implementation is very simple and robust, which makes the present approach very suitable for BIST applications. Solutions in this sense are addressed together with simulation results that validate the feasibility of the proposed approach.
Keywords
built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; BIST applications; analogue sine-wave signals; digital domain; mixed-signal built-in-self-test applications; on-chip implementation; parameter extraction; Built-in self-test; Circuits; Digital modulation; Distortion measurement; Frequency measurement; Parameter extraction; Robustness; Signal generators; Signal processing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268864
Filename
1268864
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