DocumentCode
403539
Title
On concurrent error detection with bounded latency in FSMs
Author
Almukhaizim, Sobeeh ; Drineas, Petros ; Makris, Yiorgos
Author_Institution
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
596
Abstract
We discuss the problem of concurrent error detection (CED) with bounded latency in finite state machines (FSMs). The objective of this approach is to reduce the overhead of CED, albeit at the cost of introducing a small latency in the detection of errors. In order to ensure no loss of error detection capabilities as compared to CED without latency, an upper bound is imposed on the introduced latency. We examine the necessary conditions for performing CED with bounded latency, based on which we extend a parity-based method to permit bounded latency. We formulate the problem of minimizing the number of required parity bits as an integer program and we propose an algorithm based on linear program relaxation and randomized rounding to solve it. Experimental results indicate that allowing a small bounded latency reduces the hardware cost of the CED circuitry.
Keywords
error detection; finite state machines; logic circuits; logic design; logic testing; CED circuitry; FSM; bounded latency; combinational circuits; concurrent error detection; finite state machines; integer program; linear program relaxation; parity bit minimization; parity-based method; randomized rounding; sequential circuits; upper bound; Circuit faults; Computer errors; Convolutional codes; Costs; Delay; Electrical fault detection; Fault detection; Hardware; Sequential circuits; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268910
Filename
1268910
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