• DocumentCode
    403539
  • Title

    On concurrent error detection with bounded latency in FSMs

  • Author

    Almukhaizim, Sobeeh ; Drineas, Petros ; Makris, Yiorgos

  • Author_Institution
    Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    16-20 Feb. 2004
  • Firstpage
    596
  • Abstract
    We discuss the problem of concurrent error detection (CED) with bounded latency in finite state machines (FSMs). The objective of this approach is to reduce the overhead of CED, albeit at the cost of introducing a small latency in the detection of errors. In order to ensure no loss of error detection capabilities as compared to CED without latency, an upper bound is imposed on the introduced latency. We examine the necessary conditions for performing CED with bounded latency, based on which we extend a parity-based method to permit bounded latency. We formulate the problem of minimizing the number of required parity bits as an integer program and we propose an algorithm based on linear program relaxation and randomized rounding to solve it. Experimental results indicate that allowing a small bounded latency reduces the hardware cost of the CED circuitry.
  • Keywords
    error detection; finite state machines; logic circuits; logic design; logic testing; CED circuitry; FSM; bounded latency; combinational circuits; concurrent error detection; finite state machines; integer program; linear program relaxation; parity bit minimization; parity-based method; randomized rounding; sequential circuits; upper bound; Circuit faults; Computer errors; Convolutional codes; Costs; Delay; Electrical fault detection; Fault detection; Hardware; Sequential circuits; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2085-5
  • Type

    conf

  • DOI
    10.1109/DATE.2004.1268910
  • Filename
    1268910