Regression simulation: applying path-based learning in delay test and post-silicon validation

This paper presents a novel path-based learning methodology to achieve timing regression simulation. The methodology can be applied for two purposes: (1) In pre-silicon phase, regression simulation can be used to produce a fast and approximate timing simulator to avoid the high cost associated with statistical timing simulation. (2) In post-silicon phase, regression simulation can be used as a vehicle to deduce critical paths from the pass/fail behavior observed on the test chips. Our path-based learning methodology consists of four major components: a delay test pattern set, a logic simulator, a set of selected paths as the basis for learning, and a machine learner. We summarize the key concepts in our regression simulation approach and present experimental results.