Simplified fault-tolerant FIR filter architecture based on redundant residue number system

Author

Zhibin Luan ; Xiang Chen ; Ning Ge ; Zhaocheng Wang

Author_Institution

Dept. of Electron. Eng., Tsinghua Univ., Beijing, China

Volume

50

Issue

23

fYear

2014

fDate

11 6 2014

Firstpage

1768

Lastpage

1770

Abstract

A low-cost fault-tolerant finite impulse response (FIR) filter is presented to save logic resources. Based on the redundant residue number system (RRNS), it eliminates soft errors generated by single event upset (SEU) in space applications, which requires only one three-moduli set residue to binary converter based on the Chinese remainder theorem. When a soft error happens, only one small-sized first-in-first-out and rollback operations are needed to refresh the FIR filter corrupted by SEU. Theoretical analysis and fault injections are performed to validate that there is no fault missing event. In addition, the proposed scheme can save 21% cell area compared with the conventional RRNS method.

Keywords

FIR filters; radiation hardening (electronics); residue number systems; CRT; Chinese remainder theorem; FIFO; RRNS; RTBC; SEU; fault injections; fault-tolerant FIR filter; logic resources; low-cost fault-tolerant finite impulse response filter; redundant residue number system; rollback operations; single event upset; small-sized first-in-first-out; soft errors; three-moduli set residue to binary converter;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el.2014.3508

Filename

6955139