Title :
A digital test for first-order ΣΔ modulators
Author :
Leger, Gildas ; Rueda, Adoración
Author_Institution :
Instituto de Microelectron. de Sevilla, Sevilla Univ., Spain
Abstract :
This paper presents a digital structural test for first-order Sigma-Delta modulators. A periodic digital sequence is used as a stimulus to obtain a signature of the integrator leakage. This parameter is known to be related to the modulator precision and its estimation is of great importance to assess if the modulator works as expected. As the proposed technique is fully digital, it is especially suitable to test modulators embedded in complex mixed-signal circuits.
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; modulators; sigma-delta modulation; digital structural test; first-order Sigma-Delta modulators; integrator leakage signature; mixed-signal circuits; modulator precision; modulator testing; periodic digital sequence; Automatic testing; Circuit testing; Counting circuits; Delay; Delta modulation; Delta-sigma modulation; Design automation; Digital modulation; Europe; Mathematical model;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268940
