DocumentCode :
403613
Title :
Pattern selection for testing of deep sub-micron timing defects
Author :
Mango ; Chao, C.-T. ; Wang, Li-C ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
2
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
1060
Abstract :
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating the test quality with respect to timing defects under process variations. Based on the proposed metric and a dynamic timing analyzer, we develop a pattern-selection algorithm for selecting the minimal number of patterns that can achieve the maximal test quality. To shorten the run time in dynamic timing analysis, we propose an algorithm to speed up the Monte-Carlo-based simulation. Our experimental results show that, selecting a small percentage of patterns from a multiple-detection transition fault pattern set is sufficient to maintain the test quality given by the entire pattern set. We present run-time and accuracy comparisons to demonstrate the efficiency and effectiveness of our pattern selection framework.
Keywords :
Monte Carlo methods; digital simulation; fault simulation; statistical analysis; timing; Monte-Carlo based simulation; coverage metric; deep submicron timing defects testing; dynamic timing analyzer; multiple detection transition fault pattern set; pattern selection; statistical analysis; Algorithm design and analysis; Analytical models; Automatic test pattern generation; Chaos; Circuit faults; Circuit simulation; Delay effects; Pattern analysis; Testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1269033
Filename :
1269033
Link To Document :
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