DocumentCode :
403628
Title :
Task feasibility analysis and dynamic voltage scaling in fault-tolerant real-time embedded systems
Author :
Zhang, Ying ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume :
2
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
1170
Abstract :
We investigate dynamic voltage scaling (DVS) in real-time embedded systems that use checkpointing for fault tolerance. We present feasibility-of-scheduling tests for checkpointing schemes for a constant processor speed as well as for variable processor speeds. DVS is then carried out on the basis of the feasibility analysis. We incorporate practical issues such as faults during checkpointing and state restoration, rollback recovery time, memory access time and energy, and DVS overhead. Simulation results are presented for real-life checkpointing data and embedded processors.
Keywords :
embedded systems; energy management systems; fault tolerant computing; genetic algorithms; system recovery; task analysis; checkpointing data; dynamic voltage scaling; embedded processors; energy management systems; fault tolerant real time embedded systems; genetic algorithms; memory access energy; memory access time; processor speeds; rollback recovery time; task feasibility analysis; Checkpointing; Dynamic voltage scaling; Embedded system; Energy management; Fault tolerance; Fault tolerant systems; Nonvolatile memory; Real time systems; Testing; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1269050
Filename :
1269050
Link To Document :
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