Title :
Fault tolerance of programmable switch blocks
Author :
Huang, J. ; Tahoori, M.B. ; Lombardi, F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
This paper presents a new approach for the evaluation of FPGA routing resources in the presence of faulty switches. This is considered under the worst case scenario of open faults. Signal routing in the presence of faulty switches is analyzed at switch block level; probabilistic routing (routability) is used as figure of merit for evaluating the interconnect resources of FP-GAs. The presented approach utilizes a path-based technique to find the probability of establishing a path between pairs of input and output endpoints in a switch block. The results are reported for various commercial and academic FPGAs.
Keywords :
fault diagnosis; fault tolerance; field programmable gate arrays; graph theory; network routing; probability; FPGA routing resources; fault tolerance; faulty switches; field programmable gate array; figure of merit; open faults; path based technique; probabilistic routing; probability; programmable switch blocks; signal routing; Fault tolerance; Switches;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1269086