Cmos built-in test architecture for high-speed jitter measurement

Author

Lin, Henry C. ; Taylor, Karen ; Chong, Alan ; Chan, Eddie ; Soma, Mani ; Haggag, Hosam ; Huard, Jeff ; Braat, J.

Author_Institution

University of Washington

Volume

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

Lastpage

Keywords

Built-in self-test; Clocks; Costs; Delay; Jitter; Noise measurement; Phase measurement; Semiconductor device measurement; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

DOI

10.1109/TEST.2003.1270826

Filename

1270826

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