Title :
Experiments in detecting delay faults using multiple higher frequency clocks and results from neighboring die
Author :
Yan, Haihua ; Singh, Adit D.
Author_Institution :
Auburn University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit testing; Clocks; Combinational circuits; Electrical fault detection; Fault detection; Frequency; Propagation delay; Switching circuits; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270830
