DocumentCode

403794

Title

Experiments in detecting delay faults using multiple higher frequency clocks and results from neighboring die

Author

Yan, Haihua ; Singh, Adit D.

Author_Institution

Auburn University

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

105

Lastpage

111

Keywords

Circuit faults; Circuit testing; Clocks; Combinational circuits; Electrical fault detection; Fault detection; Frequency; Propagation delay; Switching circuits; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270830

Filename

1270830