DocumentCode
403804
Title
A new methodology for adc test flow optimization
Author
Bernard, S. ; Comte, M. ; Azais, F. ; Bertrand, Y. ; Renovell, M.
Author_Institution
LIRMM, University of Montpellier
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
201
Lastpage
209
Keywords
Analog-digital conversion; Circuit testing; Costs; Integrated circuit testing; Linearity; Optimization methods; Performance evaluation; Production; Spectral analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270841
Filename
1270841
Link To Document