Title :
Testing high frequency adcs and dacs with a low frequency analog bus
Author :
Sunter, Stephen K.
Author_Institution :
LogicVision, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bandwidth; Built-in self-test; Circuit testing; Costs; Delta-sigma modulation; Frequency conversion; Integrated circuit testing; Linearity; Sampling methods; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270844
