Title :
Optical and electrical testing of latchup in I/O interface circuits
Author :
Stellari, Franco ; Song, Peilin ; McManus, Moyra K. ; Gauthier, Robert ; Weger, Alan J. ; Chatty, Kiran ; Muhammad, Mujahid ; Sanda, Pia
Author_Institution :
IBM T.J. Watson Research Center
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bipolar transistors; CMOS technology; Circuit testing; Current supplies; Electrostatic discharge; Ignition; Pins; Robustness; Thyristors; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270845
