Optical and electrical testing of latchup in I/O interface circuits

Author

Stellari, Franco ; Song, Peilin ; McManus, Moyra K. ; Gauthier, Robert ; Weger, Alan J. ; Chatty, Kiran ; Muhammad, Mujahid ; Sanda, Pia

Author_Institution

IBM T.J. Watson Research Center

Volume

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

236

Lastpage

245

Keywords

Bipolar transistors; CMOS technology; Circuit testing; Current supplies; Electrostatic discharge; Ignition; Pins; Robustness; Thyristors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

DOI

10.1109/TEST.2003.1270845

Filename

1270845

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