Title :
Designed -in-diagnostics: a new optical method
Author_Institution :
NPTest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Instruments; Laser beams; Logic circuits; Logic testing; Optical design; Optical pulse generation; Optical pulses; Optical sensors; Silicon; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270846
