Title :
Diagnosis-based post-silicon timing validation using statistical tools and methodologies
Author :
Krstic, Angela ; Wang, Li.-C. ; Cheng, Kwang-Ting ; Mak, T.M.
Author_Institution :
Intel Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit simulation; Crosstalk; Delay; Logic; Manufacturing processes; Power system modeling; Predictive models; Silicon; System testing; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270856
